Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-07-16
2000-04-25
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324709, 324 7679, G01R 2728
Patent
active
060548673
ABSTRACT:
A method for stabilizing feedback loop in impedance measuring equipment involves determining a null loop transfer function of the impedance measuring device by utilizing multiple independent, known impedances. The phase characteristics of the null loop is measured for each multiple independent, known impedances. Based on the measured phase characteristics, the loop characteristic is determined with regard to impedances of arbitrary devices under test (DUTs). The best phase compensation amount is then computed for use over the entire range of DUTs.
REFERENCES:
patent: 4276514 (1981-06-01), Huang
patent: 4933986 (1990-06-01), Leitch
patent: 5623226 (1997-04-01), Whitmarsh
Roberge, Operational Amplifiers: Theory and Practice, John Wiley & Sons, p. 171-185, 233, 537, 1975.
Do Diep N.
Hewlett--Packard Company
Kobert Russell M.
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