Scanning probe tip covered with an electrical resistance to limi

Details Scanning probe tip covered with an electrical resistance to limi Scanning probe tip covered with an electrical resistance to limi

1996-06-18

1998-05-12

Nelms, David C.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Electrical modification or sensing of storage medium

250306, G11B 900

Patent

active

057516863

ABSTRACT:
A probe for use in an information recording apparatus for recording information on a recording medium by applying a voltage between the recording medium and a tip of the probe includes a conductive tip, wiring provided on the probe for applying a voltage to the tip from a voltage application device, and an electrical resistance provided in the tip or in the wiring on the probe. The resistance may be composed of an oxide film on the surface of the tip. Instead of providing the electrical resistance, the tip or the wiring may be covered with an electromagnetic shield. As another alteractive, an electrical resistance layer may be provided between a substrate of the recording layer and the tip of the probe.

REFERENCES:
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4575822 (1986-03-01), Quate
patent: 4724318 (1988-02-01), Binnig
patent: 5289455 (1994-02-01), Kuroda et al.
patent: 5321685 (1994-06-01), Nose et al.
patent: 5396066 (1995-03-01), Ikeda et al.
patent: 5461605 (1995-10-01), Takimoto et al.
patent: 5481528 (1996-01-01), Eguchi et al.
patent: 5546374 (1996-08-01), Kuroda et al.

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