Fault detecting circuit incorporated in semiconductor sensor and

Details Fault detecting circuit incorporated in semiconductor sensor and Fault detecting circuit incorporated in semiconductor sensor and

1993-10-07

1995-08-08

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324706, 340650, G01R 3108

Patent

active

054402344

ABSTRACT:
A semiconductor sensor has piezo resistor elements formed in deformable semiconductor portions for forming a Wheatstone bridge circuit, and a fault detecting circuit is associated with the Wheatstone bridge circuit for producing a warning signal indicative of occurrence of a fault in the Wheatstone bridge circuit, wherein the fault detecting circuit has two pairs of window comparators independently monitoring two output nodes of the Wheatstone bridge circuit to see whether or not the voltage level at each of the output nodes ranges between the upper limit and the lower limit of a normal voltage range so that a destruction of one of the piezo resistor elements is detectable.

REFERENCES:
patent: 3818330 (1974-06-01), Hiroshima et al.
patent: 4956631 (1990-09-01), Itoh
patent: 5122780 (1992-06-01), Midorikawa et al.
patent: 5166880 (1992-11-01), Furui
patent: 5208484 (1993-05-01), Okano et al.

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