Lookahead structure for fast scan testing

Details Lookahead structure for fast scan testing Lookahead structure for fast scan testing

1997-07-02

1999-06-01

Beausoliel, Jr., Robert W.

Excavating

365201, G01R 3128

Patent

active

059094532

ABSTRACT:
A scan lookahead skip structure that allows a programmable number of test bits, I/O blocks, flip-flops, or columns to be skipped. One embodiment of the structure includes multiplexers to skip the scan paths for several adjacent I/O blocks, flip-flops, or columns, thereby reducing the number of clock cycles and overall delay required to utilize the scan path.

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"IEEE Standard Test Access Port and Boundary-Scan Architecture" IEEE Std 1149.1-1990, Copyright 1993, Published by the Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017.

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