Polishing method

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

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438691, 438692, 438693, 438745, 438754, H01L 21302

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active

06117775&

ABSTRACT:
A polishing technique wherein scratches, peeling, dishing and erosion are suppressed, a complex cleaning process and slurry supply/processing equipment are not required, and the cost of consumable items, such as slurries and polishing pads, is reduced. A metal film formed on an insulating film having a groove is polished with a polishing solution containing an oxidizer and a substance which renders oxides water-soluble, but not containing a polishing abrasive.

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"Pattern Geometry Effects in the Chemical-Mechanical Polishing of Inlaid Copper Structures", J. Electrochem.Soc., vol. 141 p. 2842-2848, Oct. 10, 1994.
"An Examination of Slurry for Wiring Metal's Chemical Mechanical Polishing", vol. 41, p35-37, Jun. 1997 (in Japanese).
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"Electrochemical Potentioal Measurements during the chemical-mechanical Polishing of Copper Thin Films",J.Electrochem.Soc.,vol.142, Jul. 7, 1995.
Chemical Mechanical Polishing of Copper using a Slurry composed of glycine and hydrogen peroxide:, CMP-MIC Conferences 1996 ISMIC, Feb. 22-23, 1996 CMP P.299-300, (in Japanese language) p. 387 English.

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