Method and apparatus for statistical set point bias control

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364154, 364152, 364176, 364554, 364183, G06F 1546, G05B 1302

Patent

active

048558974

ABSTRACT:
A process controller may incorporate statistical computations of the variance in the controlled variable. Statistical measures may then be used to offset the controller set point to maintain the controlled variable distribution in an acceptable specification zone. The statistical measures may be made automatically and continuously thereby obviating human intervention, while producing high quality, though statistically variable, process output. The statistical measures may be calculated specifically or generated by a weighted integration method.

REFERENCES:
patent: 3515860 (1970-06-01), Fitzgerald
patent: 3648035 (1972-03-01), Hart et al.
patent: 3758762 (1973-09-01), Littman et al.
patent: 3781533 (1973-12-01), Barnstone
patent: 3876872 (1975-04-01), Spitz
patent: 4008386 (1977-02-01), Ross
patent: 4275439 (1981-06-01), Kuwata
patent: 4320463 (1982-03-01), Himmelstein
patent: 4481567 (1984-11-01), Kaya et al.
patent: 4679136 (1987-07-01), Shigemasa
patent: 4736316 (1988-04-01), Wallman
"Statistics Invade Distributed Control Systems", George J. Bickley (Senior Editor), Control Engineering, Nov. 1987, pp. 52-54.
"Statistical Process Control Goes On-Line", Dr. Paul J. Merluzzi, Jr., (Sequential Automation Consultants), Chemical Processing, Nov. 1987, pp. 31, 32, 35.
IIE Transactions, vol. 19, No. 2, Jun. 1987, pp. 208-214, Neuhardt, J. B., "Effects of Correlated Subsamples in Statistical Process Control".
Journal of Quality Technology, vol. 7, No. 4, Oct. 1975, pp. 183-192.
Chemical Engineering, Aug. 8, 1983, pp. 73-77.
Chemical Processing, Feb. 1987, pp. 44, 46, 48.
"Statistical Process Control: Modern Concepts with an Historical Respective", Paul J. Merluzzi, Jr., ISA Paper #87-1123, pp. 733-751.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for statistical set point bias control does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for statistical set point bias control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for statistical set point bias control will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-910383

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.