Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Semiconductors for nonelectrical property
Patent
1985-05-13
1987-08-04
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Semiconductors for nonelectrical property
324158R, 324158D, 356237, 356121, 250234, G01N 2700, G01J 100, H01J 314
Patent
active
046848835
ABSTRACT:
A nondestructive method is proposed for measuring stripe dimensions in order to grade light-emitting structures such as lasers. The width of the near-field emission parallel to the stripe is measured while the laser is operating below threshold. This measurement is correlated with the actual stripe width and with the possibility of kinks developing in the light output. The width of the far-field emission perpendicular to the junction plane can also be measured, and the product of the two widths can be correlated with the stripe area and the possibility of kinks in the laser output.
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Ackerman David A.
Camarda Renato M.
Hartman Robert L.
Spector Magaly
American Telephone and Telegraph Company AT&T Bell Laboratories
Birnbaum Lester H.
Eisenzopf Reinhard J.
Nguyen Vinh P.
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