Automatic method and machine for the simultaneous testing of dat

Details Automatic method and machine for the simultaneous testing of dat Automatic method and machine for the simultaneous testing of dat

1984-06-19

1987-01-27

Fleming, Michael R.

Excavating

364200, G06F 1126

Patent

active

046399160

ABSTRACT:
A method and machine for testing data processing systems wherein the test result is an acceptance or another condition for the central processing unit of the data processing system. For each data processing system having an intended configuration, the method embodies one or more test programs, each program requiring a predetermined configuration of peripheral devices, the execution of a specific test program being started only after the verification of the presence of the required peripheral. In the absence of an intended peripheral, the test machine has means for simulating the presence of said peripheral device. The determination of the peripherals in a configuration and the selection of a test program from a library of such programs may be automatic or may be chosen by operator input. Thus, the method and machine provides of the simultaneous testing of a number of central processing units before delivery to the customers and with a configuration specified by the customer by time multiplexing peripheral test devices which can be automatically connected to the system to be tested.

REFERENCES:
patent: 4057847 (1977-11-01), Lowell
patent: 4231087 (1980-10-01), Hunsberger
patent: 4281379 (1981-07-01), Austin
patent: 4347608 (1982-08-01), Appiano
patent: 4371952 (1983-02-01), Schuck
patent: 4456951 (1984-06-01), Honneberger
patent: 4471348 (1984-09-01), London
patent: 4489414 (1984-12-01), Titherley
patent: 4511982 (1985-04-01), Kurakake
patent: 4514842 (1985-04-01), Starr
patent: 4531182 (1985-07-01), Hyatt
patent: 4535456 (1985-08-01), Bauer
patent: 4542452 (1985-09-01), Fukai

Affiliated with

Also associated with

Rating

Automatic method and machine for the simultaneous testing of dat does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic method and machine for the simultaneous testing of dat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic method and machine for the simultaneous testing of dat will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-863018