Method for determining reference position

Details Method for determining reference position Method for determining reference position

1997-04-28

1999-09-21

Font, Frank G.

Optics: measuring and testing

By polarized light examination

With light attenuation

356400, G01B 1114

Patent

active

059561491

ABSTRACT:
The reference position is determined, by using a test piece, for optically detecting the orientation of a component such as a chip for use in placement apparatus such as a chip mounter. Light is emitted from a light source toward a light sensor to cast a shadow of the test piece onto the light sensor. A first position of an end of the shadow when the pick-up device rotates at a first angle, a second position of the other end of the shadow when the pick-up device rotates at a second angle, and a third position of either end of the shadow when the pick-up device rotates at a predetermined third angle, are detected on the light sensor. Accordingly, the positional relationship of the light source, the light sensor, and the pick-up device is determined as a reference position, based on the positional data.

REFERENCES:
patent: 4615093 (1986-10-01), Tews et al.
patent: 5278634 (1994-01-01), Skunes et al.
patent: 5559727 (1996-09-01), Deley et al.

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