Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1988-05-31
1989-11-07
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
324 61P, 34087037, G01R 2726, G08C 1916
Patent
active
048795089
ABSTRACT:
Capacitive-type measuring apparatus for making absolute measurements comprises first and second support members which are relatively displaceable with respect to a measurement axis; an array of first transmitter electrodes disposed on the first support member; an array of first receiver electrodes disposed on the second support member such that differing portions of the first receiver electrode array are capacitively coupled with the first transmitter electrode array in dependence on the relative positions of the support members; an array of second transmitter electrodes disposed on the second support member so as to be spatially offset from and electrically connected to corresponding first receiver electrodes; and a second receiver electrode arrangement disposed on the first support member for sensing the voltage distribution of the electric field created by the second transmitter electrode array in response to excitation of the first transmitter electrode array with N excitation signals. The degree of offset of a second transmitter electrode relative to its corresponding first receiver electrode is a predetermined function of the distance of the second transmitter electrode from a reference position. The first receiver electrodes define a fine wavelength, the first transmitter electrodes are arranged to occupy unique relative fine wavelength segment positions, and the second receiver electrode arrangement is adapted to produce outputs in response to predetermined combinations of excitation signals applied to the first transmitter electrodes which permit different transfer functions to be sensed, thereby permitting different resolution measurements to be made with the same electrode arrays which can be combined to obtain high accuracy absolute position measurements over an extended measuring range.
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patent: 4743838 (1988-05-01), Eckerle
Eisenzopf Reinhard J.
Harvey Jack B.
Mitutoyo Corporation
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