Semiconductor device having different impurity concentration wel

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 57, 437 52, 437152, H01L 21265, H01L 2170

Patent

active

052388603

ABSTRACT:
A semiconductor device comprises an N-type semiconductor substrate, a first P-type well formed in the semiconductor substrate, a second P-type well formed adjacent to the first P-type well in the semiconductor substrate, the surface impurity concentration of the second P-type well being set lower than that of the first P-type well, a DRAM memory cell structure formed in the first P-type well, and an MOS transistor structure formed in the second P-type well to function in combination with the memory cell structure.

REFERENCES:
patent: 4403395 (1983-09-01), Curran
patent: 4516313 (1985-05-01), Turi et al.
patent: 4637125 (1987-01-01), Iwasaki et al.
patent: 4672410 (1987-06-01), Miura et al.
patent: 4673962 (1987-06-01), Chaterjee et al.
patent: 4697332 (1987-10-01), Joy et al.
patent: 5108944 (1992-04-01), Shirai et al.
"An Experimental 4Mb CMOS Dram", Furuyama, et al., 1986 IEEE International Solid-State Circuits Conference, ISSCC 86/Feb. 21, 1986.
"An Experimental 1-Mbit BiCMOS Dram", Kitsukawa, et al., IEEE Journal of Solid-State Circuits, vol. SC-22, No. 5, Oct. 1987.
"Advanced BiCMOS Technology for High Speed VLSI", Ikeda., IEDM 86, IEEE 1986.
"Bipolar CMOS Merged Structure for High Speed M Bit DRAM", Kobayashi, et al., IEDM 86, IEEE 1986.
"Physics and Technology of Semiconductor Devices", A. S. Grove, Fairchild Semiconductor, John Wiley and Sons, Inc., p. 209 (Date Unknown).
"Physics of Semiconductor Devices", S. M. Sze, John Wiley and Sons, pp. 192-193 and 196-197 (Date Unknown).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having different impurity concentration wel does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having different impurity concentration wel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having different impurity concentration wel will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-828656

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.