Instrument for measuring film thickness

Details Instrument for measuring film thickness Instrument for measuring film thickness

1985-02-05

1987-12-22

Krass, Errol A.

Boots, shoes, and leggings

324230, 73150R, G01B 710

Patent

active

047150076

ABSTRACT:
An instrument for measuring a thickness of a surface processing film on a metal includes a plurality of instruction executing keys, an enclosed recording apparatus, a terminal for connecting a probe to detect an electrical signal corresponding to the film thickness when the probe is pressed onto the metal, a circuit for converting the electrical signal obtained from the probe to a digital value indicative of the film thickness, and a circuit for arithmetically processing the digital value in accordance with instructions by the instruction executing keys. The results of the processing are outputted to the recording apparatus.

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patent: 4618825 (1986-10-01), Fischer

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