Focused electron-bombarded detector

Radiant energy – With charged particle beam deflection or focussing – With detector

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250299, H01J 37252

Patent

active

053269780

ABSTRACT:
A focused electron-bombarded (FEB) ion detector comprising an MCP, focusing means, and a collection anode disposed in a detector body. The collection anode includes a diode for receiving the focused output electron beam from the MCP. The gain between the input ion current to the MCP and the detector output signal from the diode is on the order of 1-100 million, depending on the device configuration and applied biasing voltages.

REFERENCES:
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patent: 4794296 (1988-12-01), Warde et al.
patent: 4814599 (1989-03-01), Wang
patent: 4825118 (1989-04-01), Kyushima
patent: 4918358 (1990-04-01), Arihara et al.
patent: 5101100 (1992-03-01), Kinoshita et al.

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