Lateral shear interferometer for testing aspheric surfaces

Details Lateral shear interferometer for testing aspheric surfaces Lateral shear interferometer for testing aspheric surfaces

1992-09-23

1994-03-29

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356359, 356360, 356351, G01B 902

Patent

active

052989712

ABSTRACT:
A lateral shear interferometer including a pair of cubic prisms having a diagonal semi-reflective plane as the lateral shear producing element is used to test optical components having aspheric surfaces. An effective aperture is defined by the cubic prisms such that rays propagating therewithin will leave the cubic prisms with a first beam and a second beam propagating divergently with respect to each other. An aperture stop is used to allow only one of the beams to pass therethrough while reject the other. The fringe density of the interference pattern is therefore reduced to be more suitable for analysis. The lateral shear interferometer also provides stable interference patterns as long as a deviation of the light beam incident upon the cubic prisms does not exceeds the limits defined by the effective aperture of the cubic prisms.

REFERENCES:
patent: 4743117 (1988-05-01), Kitabayashi et al.

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