Semiconductor integrated circuit device with test mode for testi

Details Semiconductor integrated circuit device with test mode for testi Semiconductor integrated circuit device with test mode for testi

1993-04-15

1996-12-03

Nguyen, Hoa T.

39518306, G06F 1122, G06F 1128

Patent

active

055816983

ABSTRACT:
An output gate means is provided which is capable of outputting individual signals selectively to an internal bus; the individual signals are interchanged among a plurality of functional modules connected to the internal bus which is interfaced with an external circuit. An input gate means is provided which is capable of supplying selectively a signal, input to the internal bus, to a specified functional module in place of an individual signal.

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