Patent
1991-05-22
1992-09-01
Wojciechowicz, Edward J.
357 238, 357 55, 357 59, H01L 2906
Patent
active
051443937
ABSTRACT:
A field effect transistor including a gate electrode, a source electrode and a drain electrode which are formed on a major surface of a silicon substrate. An impurity contained in the source electrode and the drain electrode is diffused into the silicon substrate by heat treatment of thereby form source and drain areas of the transistor. The source electrode and the drain electrode are electrically insulated from the gate electrode by a side-wall insulating film. The side-wall insulating film and the gate insulating film are formed by separate steps, so can each be formed in optimum thickness.
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Shimizu Masahiro
Yamaguchi Takehisa
Mitsubishi Denki & Kabushiki Kaisha
Wojciechowicz Edward J.
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