Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1995-12-06
1999-10-26
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356351, 356401, G01B 902
Patent
active
059737859
ABSTRACT:
Technology for forming a fine light beam having a size smaller than the theoretical limit determined by the wavelength of light and characteristics of an objective lens. A beam distribution shifter having two light transmission regions is disposed between a source of light and an objective lens, a phase shifter is provided on one of the two light transmission regions to divide the light passing through the beam distribution shifter into two light fluxes having phases opposite to each other, and the two light fluxes are focused through the objective lens to form a fine light beam having a size smaller than the theoretical limit determined by the wavelength of the light and characteristics of the objective lens due to destructive interference between the two light fluxes.
REFERENCES:
patent: 4511220 (1985-04-01), Scully
patent: 4714348 (1987-12-01), Makosch
patent: 4791650 (1988-12-01), Tatsuno et al.
patent: 4866730 (1989-09-01), Szatmari et al.
patent: 5048029 (1991-09-01), Skupsky et al.
patent: 5148442 (1992-09-01), O'Neil et al.
patent: 5298365 (1994-03-01), Okamoto et al.
F. Jenkins et al., Fundamentals of Optics, fourth edition, McGraw-Hill, New York, 1976, pp. 270-285.
J. Raffel et al., "Laser Programmed Vias for Restructurable VLSI", International Electron Devices Meeting, Dec. 1980, pp. 132-135.
Hitachi , Ltd.
Kim Robert H.
LandOfFree
Method of forming light beam, apparatus therefor, method of meas does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming light beam, apparatus therefor, method of meas, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming light beam, apparatus therefor, method of meas will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-770575