Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1992-12-22
1995-01-17
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
359110, G01N 2188
Patent
active
053830156
ABSTRACT:
Detecting and evaluating optical subcircuits created by optical splitters in an optical circuit. One or more optical wavelengths are utilized for the transmission of data; whereas, other optical wavelengths are utilized to perform optical time domain reflectometry measurements on each optical subcircuit. Following an optical splitter, each optical path from the optical splitter has inserted into it an optical filter which allows the transmission of the optical wavelengths utilized for data transmission and one of the optical wavelengths utilized to perform the optical time domain reflectometry measurements. An optical time domain reflectometry instrument transmits each of the optical wavelengths, utilized for testing, individually into the optical circuit and analyzes the returned optical pulse. Since only one optical subcircuit allows the passage of any given optical wavelength for testing, each optical subcircuit can be fully analyzed.
REFERENCES:
patent: 5063595 (1991-11-01), Ballance
patent: 5128619 (1992-07-01), Bjork et al.
patent: 5177354 (1993-01-01), Tomita et al.
patent: 5187362 (1993-01-01), Keeble
AT&T Corp.
McGraw Vincent P.
Moran John C.
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