Alignment apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356394, G01B 1100

Patent

active

046592270

ABSTRACT:
An apparatus for aligning objects on the basis of a signal obtained by scanning marks formed on the objects. A position datum representing the relative position between the objects is extracted on the basis of an extraction level. The marks are scanned a plurality of times and an average is obtained by the plural data provided on the basis of the extraction datum. Those operations are repeated with one or more different extraction levels. In each of the data group corresponding to one of the extraction data, a peculiar or exceptional datum is determined. Among the peculiar data obtained for individual sets of data, a minimum is selected. Thus, an extraction datum which results in the minimum peculiar datum is determined. The average of the position data obtained with this extraction datum is used for bringing the objects into alignment with each other.

REFERENCES:
patent: 4487505 (1984-12-01), Nakano et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Alignment apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Alignment apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Alignment apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-748295

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.