X-ray examination apparatus comprising an exposure-control syste

Details X-ray examination apparatus comprising an exposure-control syste X-ray examination apparatus comprising an exposure-control syste

1996-10-09

1998-01-20

Porta, David P.

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

378 983, H05G 100

Patent

active

057108013

ABSTRACT:
An X-ray examination apparatus (1) includes an X-ray source (2) and an X-ray image intensifier (5) for deriving an optical image from an X-ray image, which optical image is picked up by means of an image pick-up apparatus (6). The X-ray examination apparatus also includes an exposure-control system (7) for adjusting the X-ray source and/or the image pick-up apparatus on the basis of brightness values of a region of interest in the optical image. The exposure-control system includes a photodetector, for example a CCD sensor, for deriving a photodetector signal from the optical image and a photosensor for adjusting the sensitivity of the photodetector. The photodetector (9) includes an image pick-up section (11), an image memory (13) comprising separate sections, preferably including an intermediate memory (15). An electronic image in the image pick-up section is quickly transferred to an available storage section after which it is read out as an electronic image signal. For example, the electronic image is first transferred to the intermediate memory wherefrom it is quickly transferred to the image memory after which it is read out as an electronic image signal.

REFERENCES:
patent: 4991102 (1991-02-01), Nishiki
patent: 5101421 (1992-03-01), Nishiki
patent: 5164583 (1992-11-01), Aichinger et al.
patent: 5187730 (1993-02-01), Fujihara
patent: 5436952 (1995-07-01), Haendle et al.
patent: 5461658 (1995-10-01), Joosten
patent: 5530935 (1996-06-01), Dillen

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