Test plate having a thermal test pattern

Details Test plate having a thermal test pattern Test plate having a thermal test pattern

1983-12-01

1985-10-29

Yasich, Daniel M.

Thermal measuring and testing

Thermal calibration system

By thermal radiation emitting device

2502521, G01D 1800

Patent

active

045498148

ABSTRACT:
A thermal test pattern comprises motifs of a material having a high thermal emissivity which are provided on one side of a flat substrate. The substrate has a low thermal emissivity. The other side of the substrate is covered with a layer of a material having a high electrical resistivity which is provided between two conductive connection strips. The motifs and connection strips and resistive layer may be deposited by silk screening. Due to the differences in thermal emissivity, a temperature difference occurs between the substrate and the motifs, the motifs being colder, when the substrate is heated by passing an electric current through the resistive layer.

REFERENCES:
patent: 2463813 (1949-03-01), Shepard
patent: 3283148 (1966-11-01), Schwarz et al.
patent: 3492076 (1970-01-01), Back
patent: 3694624 (1972-09-01), Buchta
patent: 3977795 (1976-08-01), Buschmann
patent: 3986384 (1976-10-01), Giorgi
patent: 4058734 (1977-11-01), Vroombout
patent: 4315150 (1982-02-01), Darringer et al.
patent: 4324459 (1982-04-01), Gerharz
patent: 4387301 (1983-06-01), Wirick et al.

Affiliated with

Also associated with

Rating

Test plate having a thermal test pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test plate having a thermal test pattern, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test plate having a thermal test pattern will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-726428