Measuring arrangement

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering

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Details

204 1T, 204181R, 204195R, 204300EC, 324 30R, 324189, 324 71R, C25D 1300, C25D 1306

Patent

active

040826422

ABSTRACT:
A measuring method or arrangement for the quick, accurate, and safe measurement of electrical parameters of binders for the electrocoating process is described. According to the arrangement, digital measuring results are obtained by inserting into a deposition circuit a precision resistor R.sub.J (1), a voltage-frequency-converter (2), pertinent counter unit (3), intermediate storage unit (4), and recording unit (5) for recording of the Coulomb yield; a time element (6) for interruption of the impulse sequence coming from said voltage-frequency-converter (2) after from about 50-100 msec., an assigned counter unit (7), an intermediate storage unit (8), recording system (9), a multiplier step (11), which carries out an analogous multiplication of the voltages with one another occurring at said precision resistor R.sub.J (1) and on the voltage divider R.sub.US (10), a voltage-frequency-converter (12) for the conversion of the analogous product from (11) into impulses, a counter unit (13), an intermediate storage unit (14), and a recording system (15).

REFERENCES:
patent: 3627661 (1971-12-01), Gordon et al.
patent: 3658676 (1972-04-01), DeVittorio et al.
patent: 3676316 (1972-07-01), Domokos et al.

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