Integrated circuit tester

Details Integrated circuit tester Integrated circuit tester

1991-11-20

1995-03-14

Beausoliel, Jr., Robert W.

Excavating

G06F 1100, G01R 3128

Patent

active

053982525

ABSTRACT:
An integrated circuit tester uses the information compared between a test executed result and an expected value, for the operation of a driver, which applies test patterns to a device under test. Once a test executed result obtained from the device is compared with an expected value, the compared information is fedback to the driver so as to specify, for example, test cycles and test patterns. Therefore, in an evaluation of maximum operating frequencies, the failure which occurs in the (n+1)th lower frequency can be effectively observed without being masked by other failures which occur in the nth lower frequency or less.

REFERENCES:
patent: 4493045 (1985-01-01), Hughes, Jr.
patent: 4773071 (1988-09-01), Nielsen
patent: 5144225 (1992-09-01), Talbot et al.

Affiliated with

Also associated with

Rating

Integrated circuit tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit tester will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-717635