Method of manufacturing thin film transistor

Fishing – trapping – and vermin destroying

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437 21, 437 29, 437913, 148DIG150, H01L 21265

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active

053977181

ABSTRACT:
In a method of manufacturing a thin film transistor, when impurity ions are introduced in a channel region between source and drain regions in a semiconductor layer, an insulator layer is first formed on the semiconductor layer. Then, impurity ions generated on high frequency discharge are introduced through the insulator layer into the semiconductor layer under a specified acceleration voltage. Then, the introduction depth of impurities and the amount of the impurities to be introduced in the channel region can be controlled or the threshold voltage of the thin film transistor can be controlled. This method can be applied to a large substrate.

REFERENCES:
patent: 4312680 (1982-01-01), Hsu
patent: 4463492 (1984-08-01), Maeguchi
patent: 4523963 (1985-06-01), Ohta et al.
patent: 4951113 (1990-08-01), Huang et al.
patent: 4992838 (1991-02-01), Mori
patent: 5064775 (1991-11-01), Chang
patent: 5116771 (1992-05-01), Karulkar
patent: 5198379 (1993-03-01), Adan
patent: 5252502 (1993-10-01), Havemann
Komatsu, English abstract of 03-276765-JA.
"Formation of Source and Drain Regions for a Si:] Thin-Film Transistors by Low-Energy Ion Doping Technique", Yoshida et al., IEEE Electron Device Letters, vol. 9, No. 2, Feb. 1988, pp. 90-93.

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