Probe and a cantilever formed with same material

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Mechanical modification or sensing of storage medium

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369126, 250306, G11B 900, G02B 2100

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active

059599570

ABSTRACT:
A probe has a metal tip on a cantilever. A diffused layer made from a metal silicide is formed at an interface between the tip and the cantilever. In the diffused layer, a material for forming the cantilever and a material for forming the tip are diffused.

REFERENCES:
patent: 3664874 (1972-05-01), Epstein
patent: 4614119 (1986-09-01), Zavracky et al.
patent: 5221415 (1993-06-01), Albrecht et al.
patent: 5248079 (1993-09-01), Li
patent: 5321685 (1994-06-01), Nose et al.
patent: 5357108 (1994-10-01), Suzuki et al.
patent: 5357787 (1994-10-01), Kado et al.
patent: 5506829 (1996-04-01), Yagi et al.
patent: 5546375 (1996-08-01), Shimada et al.
patent: 5631463 (1997-05-01), Kawasaki et al.
patent: 5717132 (1998-02-01), Watanabe et al.
C. Spindt et al. "Physical properties of thin-film field emission cathodes with molybdenum cones," J. Appl. Phys; vol. 47, Dec. 1976, pp. 5248-5263.
O. Wolter et al., "Micromachined Silicon Sensors for Scanning Force Microscopy", J. Vac. Sci. Tech. B 9(2), Mar./Apr. 1991, pp. 1353-57.
Patent Abstracts of Japan, vol. 018, No. 332 (E-1567), Jun. 23, 1994 & JP 06 084455 A (Canon Inc), Mar. 25, 1995.

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