Particle sampling system for gas supply system

Measuring and testing – Sampler – sample handling – etc. – Flow divider – deflector – or interceptor

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73 2801, 7386358, G01N 120

Patent

active

055378790

ABSTRACT:
A particle sampling system which includes a flow restrictor positioned in a conduit between a vent and an analyzer probe and restricts flow in the conduit to maintain an overpressure of sample gas at the counter probe which, in turn, forces the gas sample into the particle analyzer. The system further includes a reservoir for holding a working fluid usable with a particle analyzer and a pressurized gas source which is used to pressurize the reservoir to enable supply of the working fluid against the pressure of the gas analysis sample and to provide a purge gas for the analyzer.

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patent: 5460054 (1995-10-01), Tran
Microcontamination, Mar. 1992, "Providing Next-Generation Particle Measurement and Control for Ultra-High-Purity Distribution Systems" J. D. Borkman, W. R. Couch and M. L. Malczewski, 7 pages.
Particle Measuring Systems Inc., Data Sheet, High Pressure Gas Probes 2 pages published by Jul. 1995.

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