Product inspection method and apparatus

Image analysis – Histogram processing – For setting a threshold

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382 8, 382 1, 356408, 209581, G06K 900

Patent

active

053352939

ABSTRACT:
Described herein is an automated quality inspection station for evaluating color component characteristics of a product. The inspection station includes a color video camera, for capturing video frames of product images, and a control system for analyzing those video frames. The control system is programmed to perform a reference calibration and then a sample calibration. During the reference calibration an operator identifies component type areas from a displayed reference frame of a typical product assortment. The control system calculates color value density curves from the identified areas. The density curves are then calibrated to each other by scaling each of the density curves by a scaling factor. The scaling factors can either be provided directly by the operator or default values can be calculated by the control system. Default scaling factor values are calculated by summing the product of the corresponding density curve and an overall histogram of a sample video frame over a range of color values. Individual pixels are classified as one of a plurality of component types according to the highest calibrated density curve at the pixels' color value.

REFERENCES:
patent: 3999041 (1976-12-01), Scofield
patent: 3999047 (1976-12-01), Green
patent: 4238768 (1980-12-01), Mitsuya et al.
patent: 4251837 (1981-02-01), Janeway, III
patent: 4326258 (1982-04-01), de la Guardia
patent: 4338024 (1982-07-01), Bolz et al.
patent: 4439789 (1984-03-01), Cahill
patent: 4543660 (1985-09-01), Maeda
patent: 4567610 (1986-01-01), McConnell
patent: 4574393 (1986-03-01), Blackwell et al.
patent: 4590606 (1986-05-01), Rohrer
patent: 4601057 (1986-07-01), Tsuji et al.
patent: 4637054 (1987-01-01), Hashim
patent: 4656665 (1987-04-01), Pennebaker
patent: 4713781 (1987-12-01), Brizgis et al.
patent: 4731863 (1988-03-01), Sezan et al.
patent: 4742551 (1988-05-01), Deering
patent: 4742556 (1988-05-01), Davis, Jr. et al.
patent: 4742557 (1988-05-01), Ma
patent: 4748573 (1988-05-01), Sarandrea et al.
patent: 4764971 (1988-08-01), Sullivan
patent: 4792979 (1988-12-01), Nomura et al.
patent: 4804842 (1989-02-01), Nakajima
patent: 4807163 (1989-02-01), Gibbons
patent: 4811090 (1989-05-01), Khurana
patent: 4812904 (1989-03-01), Maring et al.
patent: 4856528 (1989-08-01), Yang et al.
patent: 4868883 (1989-09-01), Chen
patent: 4901258 (1990-02-01), Akiyama
patent: 4907282 (1990-03-01), Daly et al.
patent: 4941192 (1990-07-01), Mishima et al.
patent: 4945478 (1990-07-01), Merickel et al.
patent: 4951825 (1990-08-01), Hawkins
patent: 4955067 (1990-09-01), Shimura
patent: 4959869 (1990-09-01), Hongo
patent: 4962540 (1990-10-01), Tsujiuchi et al.
patent: 4972493 (1990-11-01), Chemaly
patent: 4975972 (1990-12-01), Bose et al.
patent: 4977605 (1990-12-01), Fardeau et al.
patent: 4979225 (1990-12-01), Tsujiuchi et al.
patent: 4992949 (1991-02-01), Arden
patent: 5046118 (1991-09-01), Ajewole et al.
patent: 5048095 (1991-10-01), Bhanu et al.
patent: 5060279 (1991-10-01), Crawford et al.
patent: 5060290 (1991-10-01), Kelly et al.
patent: 5085325 (1992-02-01), Jones et al.
Ye, Qin Zhang, et al. "On Minimum Error Thresholding and Its Implementations", Pattern Recognition Letter No. 4 Amsterdam, The Netherlands, (Apr. 7, 1988) pp. 201-206.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Product inspection method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Product inspection method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Product inspection method and apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-70555

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.