Scattermeter using polarized light to distinguish between bulk a

Details Scattermeter using polarized light to distinguish between bulk a Scattermeter using polarized light to distinguish between bulk a

1985-10-09

1987-05-26

LaRoche, Eugene R.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356369, G01J 400

Patent

active

046688609

ABSTRACT:
Scattermeter for evaluating the surface quality of an optical element made from a material that has bulk scattering of light by measuring the light scattering from the surface while disregarding the bulk scatter, with the surface scatter being distinguished from the bulk scatter by their different polarization characteristics. The scattermeter is comprised of an illuminator optic providing an intense, substantially collimated light beam with a controlled variable state of polarization illuminating a defined area of the surface of said optical element. It is also comprised of a collector optic with a controlled field of view limited to an area substantially equal to the area illuminated by said illuminator optic, a polarization sensitive optical modulator, a photoelectric detector, a demodulating amplifier, and a readout device.

REFERENCES:
patent: 3822098 (1974-07-01), Rudder et al.
patent: 4469442 (1984-09-01), Reich

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