Structure and method internal photoemission detection

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257436, 257455, 257457, 257448, 257449, H01L 2944, H01L 2948, H01L 3106

Patent

active

052850986

ABSTRACT:
A method and structure are provided for internal photoemission detection. At least one groove (30a) is formed in a side of a semiconductor layer (32). A silicide film (58) is formed in each groove (30a) over the semiconductor layer (32). A metal contact region (44) is electrically coupled to the silicide film (58) such that a voltage at the metal contact region (44) indicates an intensity of radiation incident on the structure (28).

REFERENCES:
patent: 3963926 (1976-06-01), Borrello
patent: 4875084 (1989-10-01), Tohyama
patent: 4876586 (1989-10-01), Dyck
patent: 4939561 (1990-07-01), Yamaka et al.
Bor-Yeu Tsaur, C. K. Chen and John-Paul Mattia, PtSi Schottky-Barrier Focal Plane Arrays for Multispectral Imaging in Ultraviolet, Visible and Infrared Spectral Bands, IEEE Electron Device Letters, vol. 11, No. 4, Apr. 1990.
Bor-Yeu Tsaur, M. M. Weeks, R. Trubiano, P. W. Pellegrini and T. -R. Yew, IrSi Schottky-Barrier Infrared Detectors with 10 .mu.m Cutoff Wavelength, IEEE Electron Device Letters, vol. 9, No. 12, Dec. 1988.
Bor-Yeu Tsaur, M. M. Weeks, and P. W. Pellegrini, Pt-Ir Silicide Schottky-Barrier IR Detectors, IEEE Electron Device Letters, vol. 9, No. 2, Feb. 1988.
Bor-Yeu Tsaur, C. K. Chen and S. A. Marino, Long-Wavelength Ge.sub.x Si.sub.1-x /Si Heterojunction Infrared Detectors and 400x400-Element Imager Arrays, IEEE Electron Device Letters, vol. 12, No. 6, Jun. 1991.
Bor-Yeu Tsaur, M. J. McNutt, R. A. Bredthauer and R. B. Mattson, 128x128-Element IrSi Schottky-Barrier Focal Plane Arrays for Long-Wavelength Infrared Imaging, IEEE Electron Device Letters, vol. 10, No. 8, Aug. 1989.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Structure and method internal photoemission detection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure and method internal photoemission detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure and method internal photoemission detection will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-700142

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.