Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor
Patent
1995-08-03
1998-09-29
Niebling, John
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Compound semiconductor
438 41, 438 45, 438681, H01L 2100
Patent
active
058145346
ABSTRACT:
In a method for doping with beryllium, when epitaxially growing a III-V compound semiconductor, (MeCP).sub.2 Be is employed as a dopant source. Since (MeCP).sub.2 Be has a lower vapor pressure than diethylberyllium (DEBe) which is conventionally employed as the dopant source doping control is facilitated. In addition, since (MeCP).sub.2 Be having a higher purity than DEBe is easily obtained, impurities such as oxygen are not incorporated into the active layer during doping, whereby a high quality p type layer is realized.
REFERENCES:
patent: 3783054 (1974-01-01), Marlett et al.
patent: 5202283 (1993-04-01), Younger et al.
patent: 5358897 (1994-10-01), Valster et al.
patent: 5369289 (1994-11-01), Tamaki et al.
patent: 5565693 (1996-10-01), Sasaki et al.
patent: 5679603 (1997-10-01), Kimura et al.
patent: 5686738 (1997-11-01), Moustakas
patent: 5708301 (1998-01-01), Iyechika et al.
Tejwani et al., Growth And Diffusion Of Abrupt Beryllium-Doped Profiles In Gallium Arsenide by Organometallic Vapor Phaser Epitaxy, Applied Physics Letters, vol. 53, No. 24, 1988, pp. 2411-2413.
Ohtsuka et al., "Extremely High Be Doping Of InGaAs By Low-Temperature Atomic Layer Epitaxy", Journal of Crystal Growth, vol. 115, 1991, pp. 460-463.
Weyers et al., "Gaseous Dopant Sources in MOMBE/CBE", Journal of Crystal Growth, Vo. 105, No. 1, Oct. 1, 1990, pp. 383-392.
Kimura et al., "Metalorganic Vapor Phase Epitaxy Growth of Be-Doped InP Using Bismethylcyclopentadienyl-Berylium", vol. 34, No. 2b, Feb. 1995, pp. 1106-1108.
Ishida Takao
Kimura Tatsuya
Mitsubishi Denki & Kabushiki Kaisha
Niebling John
Pham Long
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