Method of producing a semiconductor device

Fishing – trapping – and vermin destroying

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148 334, 148 335, 148DIG59, 437107, H01L 2120, H01L 21203, H01L 21205

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051837781

ABSTRACT:
A semiconductor device is produced by forming a crystalline substrate of a first layer of Si and a second layer of GaAs or GaAs-containing compound formed on the first layer, wherein a Ge or Ge-containing crystalline layer is formed as an intervening layer between the second layer and the first layer.

REFERENCES:
patent: 4226649 (1980-10-01), Davey et al.
patent: 4325181 (1982-04-01), Yoder
patent: 4400221 (1983-08-01), Rahilly
patent: 4716445 (1987-12-01), Sone
patent: 4891329 (1990-01-01), Reisman et al.
patent: 4897367 (1990-01-01), Ogasawara
patent: 5047365 (1991-09-01), Kawanaka et al.
patent: 5091333 (1992-02-01), Fan et al.
Fischer et al., "GaAs Bipolar Transistors Grown on (100) Si Substrates by Molecular Beam Epitaxy", Appl. Phys. Lett., vol. 47, No. 4, Aug. 15, 1985, pp. 397-399.
Dumke et al., "Heterostructure Long Lifetime Hot Electron Transistor", IBM Technical Disclosure Bulletin, vol. 24, No. 7A, Dec. 1981, pp. 3229-3231.
Sheldon et al., "Growth and Patterning of GaAs/Ge Single Crystal Layers on Si Substrates by Molecular Beam Epitaxy", Appl. Phys. Lett., vol. 45, No. 3, Aug. 1, 1984, pp. 274-276.

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