Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-06-23
2000-08-01
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, G01B 1114
Patent
active
060974907
ABSTRACT:
An optical position measuring instrument, by way of which, along with other position signals regarding the relative location of two objects movable relative to one another, additionally at least one reference pulse signal regarding a defined relative position of the two objects can be generated. This instrument includes a light source, and a reference pulse transmission structure disposed upstream of the light source, which structure has a first irregular distribution of regions with two different optical properties, the beam path being divergent between the light source (LQ) and the reference pulse transmission structure (S). In addition, a reference pulse scale structure is provided adjacent to the transmission structure; this scale structure has an irregular distribution of regions with two different optical properties. Furthermore, a reference pulse scanning structure is provided downstream of the reference pulse scale structure and has a third irregular distribution of regions with two different optical properties. The reference pulse scale structure is disposed in movable fashion relative to the reference pulse transmission structure and the reference pulse scanning structure. The three distributions of regions with different optical properties are selected such that in the case of a defined relative position of the structures movable relative to one another, a reference pulse signal of adequate intensity results.
REFERENCES:
patent: 4823001 (1989-04-01), Kobayashi et al.
patent: 5065017 (1991-11-01), Hoech
patent: 5067816 (1991-11-01), Ichikawa
patent: 5428445 (1995-06-01), Holzapfel
Holzapfel Wolfgang
Mayer Elmar Josef
Dr. Johannes Heidenhain GmbH
Font Frank G.
Nguyen Tu T.
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