Source discriminator for measuring angle of arrival and waveleng

Details Source discriminator for measuring angle of arrival and waveleng Source discriminator for measuring angle of arrival and waveleng

1975-07-10

1976-11-16

Gensler, Paul L.

Optics: measuring and testing

For optical fiber or waveguide inspection

250203R, 356 79, 356141, G01N 2122

Patent

active

039920992

ABSTRACT:
The embodiment of the invention disclosed herein is directed to an angle of arrival source discriminator for determining both the spectral content of incident radiant energy and for simultaneously determining the angle of arrival of said incident radiant energy. The discriminator system includes first and second planar detector means positioned adjacent one another and arranged to have their planar surfaces transversely positioned to one another. Connected to the planar detector means are signal receiving and indicating devices, such as ammeters, or the like, for producing output signals in response to the angle of incidence of radiant energy impinging upon the planar surfaces thereof. A diffraction grating is positioned adjacent the planar detector means and oriented substantially at 45.degree. relative to the planar detector means so that signal information impinging on the planar detector means can be compared by analog or digital circuitry to determine both the angle of arrival of the radiant energy and the wavelength thereof.

REFERENCES:
patent: 3137794 (1964-06-01), Seward
patent: 3435246 (1969-03-01), Webb
patent: 3469102 (1969-09-01), Huvers
patent: 3478219 (1969-11-01), Nutz
patent: 3518443 (1970-06-01), Engelmann
patent: 3541338 (1970-11-01), Duda et al.
patent: 3780966 (1973-12-01), Newcomb, Jr. et al.
patent: 3781110 (1973-12-01), Leitz et al.
patent: 3837744 (1974-09-01), Egan et al.
patent: 3856401 (1974-12-01), Heitmann et al.

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