Test apparatus circuit

Chemistry: physical processes – Physical processes – Crystallization

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Details

23253R, 73 641, 73 59, G01N 3316, G01N 1116

Patent

active

040266710

ABSTRACT:
A circuit and apparatus combination for maintaining a balanced or regulated operational condition in test apparatus that includes mechanical drive and sensor elements as the sensor is exposed to the changing conditions experienced in a test sample or a sampled environment. The circuit automatically drives mechanical elements of the system at a resonant frequency or at other prescribed conditions with voltage changes at an output section of the circuit being indicative of changes in the sample tested or in the sensors environment. Drive elements of the circuit are powered by a drive voltage to cause movement of the sensor and the changing power thus used is evaluated and cancelled out, while a separate input or response voltage that is derived from the resulting movement of the same drive elements is introduced to an Operational Transconductance Amplifier together with an input control current likewise derived from such response voltage. The output current therefrom, which is a product of the separate input voltage times the input control current times a constant related to the transconductance amplifier, provides the changing drive voltage that is necessary to maintain the mechanical elements and sensor at their resonant or otherwise regulated and desired condition as the sensor environment changes. The changing drive voltage as the sensor is exposed to changing conditions provides a readout at an output section of the circuit that is indicative of changes in the sample or the sensor environment.

REFERENCES:
patent: 3535084 (1970-10-01), Izawa et al.
patent: 3741002 (1973-06-01), Simons
patent: 3961898 (1976-06-01), Neeley

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