Statistical enhancement of the accuracy of a ratio-matched netwo

Details Statistical enhancement of the accuracy of a ratio-matched netwo Statistical enhancement of the accuracy of a ratio-matched netwo

1978-06-01

1980-09-23

Shoop, William M.

Electricity: power supply or regulation systems

Remote sensing

307109, 361328, G05F 300

Patent

active

042245648

ABSTRACT:
A statistically enhanced ratio-matched network in a circuit chip is disclosed. The network may be either a resistance network or a capacitance network. In a ratio-matched resistance network, such as an R-2R resistance ladder, a plurality of resistances in a circuit chip have a rational ratio of resistance values to each other. All of the resistances each consists of an integral number of simultaneously fabricated resistors of approximately uniform dimensions, and certain critical resistances each consists of a series-parallel combination of the resistors for statistically enhancing the accuracy of the rational ratio of the critical resistances to each other.

REFERENCES:
patent: 3453529 (1969-07-01), Richman
patent: 3477031 (1969-11-01), Nagata
patent: 3513417 (1970-05-01), Worcester
patent: 3541430 (1970-11-01), Luger
patent: 3644802 (1972-02-01), Dingwall

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