Sampling technique for waveform measuring instruments

Details Sampling technique for waveform measuring instruments Sampling technique for waveform measuring instruments

1996-01-12

1998-04-14

Trammell, James P.

Boots, shoes, and leggings

364483, 324121R, 324 7619, 324 7624, 324 7628, 324 7638, 315367, 345134, G01R 1320

Patent

active

057400644

ABSTRACT:
A new sampling technique for waveform measuring instruments (including methods and circuits for implementing same) comprises the step of processing a series of digital signal samples through a decimator to extract a decimated sample value from each decimated sample interval in a series of decimated sample intervals. The series of digital signal samples is simultaneously processed through a digital peak detector to extract maximum and minimum values (peak detect sample values) from each decimated sample interval. For a given decimated sample interval, a difference between the maximum and minimum sample values for the interval is calculated. If the difference exceeds a glitch detect threshold value, the maximum and minimum sample values for the given decimated sample interval are transferred to a video sample memory. If not, the decimated sample value for the given decimated sample interval is transferred to the video sample memory.

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