Position measuring system

Details Position measuring system Position measuring system

1996-07-12

1998-04-14

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

250237G, G01B 1100

Patent

active

057399115

ABSTRACT:
A position measuring system having an illuminating device for generating a beam of light. A graduation support is provided with a graduation and a reference marker with a first set of graduation markings, where the graduation support receives the beam of light and generates a second beam of light. A scanning plate moves along a measuring direction and receives the second beam of light and generates a third beam of light, wherein the scanning plate has a second set of graduation markings for scanning the first set of graduation markings of the reference marker. A first photodetector and a second photodetector receive portions of the third beam of light and generate position-dependent electrical signals, wherein either the first set of graduation markings of the reference marker or the second set of graduation markings have a structure which deflects in the measuring direction.

REFERENCES:
patent: 4636076 (1987-01-01), Pettigrew
patent: 4677293 (1987-06-01), Michel
patent: 5061073 (1991-10-01), Michel

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