Signature analysis usage for fault isolation

Details Signature analysis usage for fault isolation Signature analysis usage for fault isolation

1995-12-27

1997-07-29

Beausoliel, Jr., Robert W.

Excavating

371 251, 371 671, 3951832, 39518401, G01R 3128, G06F 1100

Patent

active

056527543

ABSTRACT:
Test equipment and test methods employing signature analysis to achieve fault isolation of digital modules. Fault free signatures and faulty signatures of a digital module are stored in a lookup table that are derived from physical measurement or simulation of all components thereof. Test input signals are then applied to a digital module under test, and outputs and test points thereof are applied to a multiple input shift register signal analyzer. The multiple input shift register signal analyzer performs pass/fail signature analysis using the applied signals. Test inputs from a source (either on-board the module or external thereto) are applied to the digital module under test. When a failure occurs during testing of the digital module under test, comparator circuitry is used to find a corresponding signature match with the stored faulty signatures. A message is then sent as an output from the comparator circuitry identifying the failed node so that the digital module under test can be repaired. The present invention does not require expensive automatic test equipment and therefore provides a more cost-effective approach to failure analysis.

REFERENCES:
patent: 3851161 (1974-11-01), Sloop
patent: 4503536 (1985-03-01), Panzer
patent: 4601033 (1986-07-01), Whelan
patent: 4791359 (1988-12-01), Raymond et al.
patent: 4801870 (1989-01-01), Eichelberger et al.
patent: 5081626 (1992-01-01), Scott

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