Apparatus and method for optical measuring and imaging of electr

Details Apparatus and method for optical measuring and imaging of electr Apparatus and method for optical measuring and imaging of electr

1988-02-11

1990-05-15

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

324 77K, 350356, G01R 2316

Patent

active

049260430

ABSTRACT:
An apparatus and method include using an electro-optic crystal lying on a component surface, the crystal being coated with a cooperating electrode which is transparent to a sampling laser beam to optically measure and image electrical potentials and voltage levels independently of topographical influences.

REFERENCES:
patent: 4510441 (1985-04-01), Yasuda et al.
patent: 4595876 (1986-06-01), Kuhara et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4631402 (1986-12-01), Nagatsuma et al.
patent: 4701697 (1987-10-01), Lubbers et al.
patent: 4786858 (1988-11-01), Haas et al.
Publication by Valdmanis et al. "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1 (Jan. 1986) pp. 69-78.
Publication by Meyer, "Two Dimensional E-Field Mapping with Subpicosecond Resolution", Springer Series in Electro Physics, vol. 21, 1985, pp. 46-49.
Publication by Freeman et al. "Electro-optic Sampling of Planar Digital GaAs Integrated Circuits", Applied Physics Letters, vol. 47, No. 10, Nov. 1985, pp. 1083-1084.
Publication by Weingarten et al. "Direct Electro-Optic Sampling of GaAs Integrated Circuits", Electronics Letters vol. 21, No. 17 Aug. 15, 1985, pp. 765, 766.

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