Monolithic ratiometric temperature measurement circuit

Details Monolithic ratiometric temperature measurement circuit Monolithic ratiometric temperature measurement circuit

1989-06-30

1991-07-09

Miller, Stanley D.

Electrical transmission or interconnection systems

Personnel safety or limit control features

Interlock

307491, H03K 326, G06G 710

Patent

active

050308491

ABSTRACT:
A signal conditioning circuit for an RTD includes feedback means to correct for the non-linear temperature characteristic of the RTD. The feedback means applies to the RTD a voltage which is a linear function of temperature, plus a fixed offset. The output signal from the circuit is proportional both to the RTD temperature and to the supply voltage. The resistors in the feedback system can be trimmed easily at a single temperature to calibrate the output. It can be combined with a metal film RTD on a single chip. The trimming can compensate for wide differences in RTD resistances.

REFERENCES:
patent: 3882725 (1975-05-01), Rao et al.
patent: 3921453 (1975-11-01), Platzer, Jr.
patent: 3934476 (1976-01-01), Lamb, II
patent: 3973147 (1976-08-01), Yu
patent: 4556330 (1985-12-01), Regtien
patent: 4650347 (1987-03-01), Shigemura et al.
patent: 4883992 (1989-11-01), Koglin et al.
Nelson, "Simple Circuit Compensates Platinum Temperature Sensor", Jun. '85, 66-68, The Industrial and Process Control Magazine.
Dunets et al., Improved Accuracy in Compensating for Temperature Change at the Free Ends of Thermoelectric Sensors, May '88, Measurement Techniques, vol. 31, No. 5, pp. 474-476.

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