Dual beam fourier spectrometer

Details Dual beam fourier spectrometer Dual beam fourier spectrometer

1982-09-30

1985-09-03

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

045389101

ABSTRACT:
A dual beam Fourier-type spectrometer is disclosed in which the collimated output beam of a Michelson type interferometer is divided (post-interferometer) by a reflector which (a) reflects the bulk of said beam to the sample and thereafter a first detector, but (b) transmits part of said beam (preferably through apertures in the reflector) directly to a second detector. The relatively small portion of said beam which is transmitted to the second detector preferably passes through a substantial number of very small apertures in the reflector which are spaced in such a way as to maximize the spatial identity of the beams reaching the first and second detectors.

REFERENCES:
patent: 4165938 (1979-08-01), Doyle
patent: 4183669 (1980-01-01), Doyle
patent: 4190366 (1980-02-01), Doyle
patent: 4265540 (1981-05-01), Doyle
patent: 4395775 (1983-07-01), Roberts et al.

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