Method and apparatus for simultaneously testing the inductance o

Details Method and apparatus for simultaneously testing the inductance o Method and apparatus for simultaneously testing the inductance o

1995-03-31

1997-07-01

O'Shea, Sandra L.

Electricity: measuring and testing

Of geophysical surface or subsurface in situ

For small object detection or location

324546, 324202, G01V 310, G01R 3102

Patent

active

056442360

ABSTRACT:
In a two-channel magnetic metal detector having first and second mutually inductively coupled detection coils connected to first and second detection channels, respectively, the inductance of the coils is tested by applying a square wave test signal to the first detection coil and determining if the resulting output signal from the second detection channel has a magnitude falling within a range of magnitudes defined by two threshold values stored in a non-volatile memory. A microcomputer applies digital signals to a digital to analog converter to generate the square wave. The output signal from the second detection channel is repetitively sampled and digitized and the digital values are transferred to the microcomputer which includes means for comparing the digital values with the threshold values. If a comparison determines that the magnitude of the output signal from the second detection channel does not fall within the range of magnitudes defined by the threshold values, the microcomputer generates an error indication.

REFERENCES:
patent: 3408493 (1968-10-01), Westover et al.
patent: 4084135 (1978-04-01), Enabnit
patent: 4433528 (1984-02-01), Bohman
patent: 4480753 (1984-11-01), Thomas et al.
patent: 4538771 (1985-09-01), Tardy
patent: 4639666 (1987-01-01), Strosser et al.
patent: 4866377 (1989-09-01), Macovschi
patent: 5043666 (1991-08-01), Tavernetti et al.
Raymond Serway; Mutual Inductace; Physics for Scientists and Engineers; Saunders College Publishing; pp. 731-732 1986.

Affiliated with

Also associated with

Rating

Method and apparatus for simultaneously testing the inductance o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for simultaneously testing the inductance o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for simultaneously testing the inductance o will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-600188