Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-09-10
1995-10-17
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324530, G01R 3100, G01R 31302, G02F 113
Patent
active
054594090
ABSTRACT:
The present invention provides an electro-optical element arranged to face a liquid crystal base plate, an electric source to impress an electric voltage between them, a source of light for irradiating light on the electro-optical element, a light detector to receive the reflected light from the electro-optical element, and a mounting device for fixing the liquid crystal base plate in a fixed position. The mounting device has a highly flat surface, groove thereon and vacuum attaches the liquid crystal base plate on the surface of the base platform. Light irradiates a reflective layer located on the lower surface of an electro-optical element which is in close proximity to the liquid crystal display base plate. A voltage is applied across the electro-optical element and the light reflected by the electro-optical element are measured. The optical characteristics of the electro-optical element is measured. The optical characteristics of the electro-optical element change in proportion to the electric field across it. The electric field is supplied in part by the liquid crystal display base plate being tested. Thus, by measuring the reflected light, the integrity of the liquid crystal display base plate is evaluated.
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Bowser Barry C.
Photon Dynamics, Inc.
Wieder Kenneth A.
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