Fishing – trapping – and vermin destroying
Patent
1985-07-19
1988-02-23
Roy, Upendra
Fishing, trapping, and vermin destroying
357 15, 357 67, 357 91, 437 39, 437 89, 437170, 437200, H01L 21265, H01L 2972, C23F 102
Patent
active
RE0326135
ABSTRACT:
In the fabrication of a metal oxide semiconductor field effect transistor (MOSFET) or of a metal gate field effect transistor (MESFET), characterized by a polycrystalline silicon gate (13) and a short channel of about a micron or less, a sequence of steps is used involving the simultaneous formation of source, drain, and gate electrode contacts by a bombardment with a transition metal, such as platinum, which forms metal-silicide layers (19, 21, 18) on the source and drain regions (10.1, 10.2) as well as the silicon gate electrode (13).
REFERENCES:
patent: 4026742 (1977-05-01), Fujino
patent: 4038107 (1977-07-01), Marr et al.
patent: 4056642 (1977-11-01), Saxena et al.
patent: 4096622 (1978-06-01), McIver
patent: 4107835 (1978-08-01), Bindell et al.
patent: 4109372 (1978-08-01), Geffken
patent: 4116721 (1978-09-01), Ning et al.
patent: 4128670 (1978-12-01), Gaensslen
patent: 4141022 (1979-02-01), Sigg et al.
patent: 4173818 (1979-11-01), Bassous et al.
patent: 4180596 (1979-12-01), Crowder et al.
patent: 4319395 (1982-03-01), Lund et al.
patent: 4384301 (1983-05-01), Tasch, Jr. et al.
Ottaviani et al. Phys. Rev. Letts. 44 (Jan. 1980) 284.
Tsaur et al. Appl. Phys. Letts. 34 (1979) 168.
Tsaur et al. Appl. Phys. Letts. 35 (Aug. 1979) 225.
Lepselter Martin P.
Sze Simon M.
American Telephone and Telegraph Company AT&T Bell Laboratories
Caplan David I.
Roy Upendra
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