Production method of a semiconductor dynamic sensor

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437901, 437921, 205656, C25F 312

Patent

active

056438036

ABSTRACT:
It is intended to provide an etching method for semiconductor devices in which the etching depth or the thickness of a thin thickness portion can be precisely controlled. According to experiment results, when a P-type substrate in which an N-type epitaxial layer is formed is immersed in an etching solution such as KOH or the like, and a voltage for reverse bias of PN junction is applied between an electrode plate opposing the substrate and the epitaxial layer to perform electrochemical etching, it has been found that the distance from the PN junction plane to the etching stop position is approximately equal to a depletion layer width at the substrate side of the PN junction portion. Namely, the etching stops at the forward end of the depletion layer. Therefore, the junction depletion layer width at the substrate side is controlled to be a size obtained by subtracting a necessary depth for etching from a thickness of the semiconductor substrate except for the semiconductor layer, so that the etching depth or the thickness of the thin thickness portion remaining after etching can be precisely controlled.

REFERENCES:
patent: 4054497 (1977-10-01), Marshall
patent: 4664762 (1987-05-01), Hirata
patent: 4995953 (1991-02-01), Yee
patent: 5167778 (1992-12-01), Kaneko et al.
Kloeck et al: "Study of Electrochemical Etch-Stop for High-Precision Thickness Control of Silicon Membranes" IEEE Transactions on Electron Devices, vol. 36, No. 4, Apr. 1989, pp. 663-669.
Sarro et al: "Silicon Cantilever Beams Fabricated by Electrochemically Controlled Etching for Sensor Applications", Journal of the Electochemical Society, vol. 133, No. 8, Aug. 1986, pp. 1724-1729.
Kim et al: "Temperature Sensitivity in Silicon Piezoresistive Pressure Transducers", IEEE Transactions on Electron Devices, vol. ED-30, No. 7, Jul. 1983, pp. 802-810.
Patent Abstracts of Japan, vol. 011, No. 249, (E-532) Aug. 13, 1987, & JP-A-62 061 374, Mar. 18, 1987.
S.M. Sze, Physics of Semiconductor Devices, John Wiley & Sons, Inc. (1981) pp. 74-79.
IEEE Electron Device Letters, vol. EDL-2, No. 2 Feb. 1981 pp. 44-45 An Electrochemical P.N Junction Etch-Stop for the formation of silicon Microstructures, T.N. Jackson et al.
Electrochemically controlled Thinning of Silicon, by H.a. Waggener (Manuscript received Dec. 31, 1969) pp. 472-475.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Production method of a semiconductor dynamic sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Production method of a semiconductor dynamic sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Production method of a semiconductor dynamic sensor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-596286

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.