Self-checking on-line testable static ram

Details Self-checking on-line testable static ram Self-checking on-line testable static ram

1990-06-26

1993-04-06

Beausoliel, Robert W.

Excavating

371 671, 365131, G06F 1540

Patent

active

052009637

ABSTRACT:
A fault-tolerant random access memory for use in fault-tolerant computers. It comprises a plurality of memory chips each comprising a plurality of on-line testable and correctable memory cells disposed in rows and columns for holding individually addressable binary bits and provision for error detection incorporated into each memory cell for outputting an error signal whenever a transient error occurs therein. Each of the memory cells comprises a pair memory sub-cells for simultaneously receiving and holding a common binary data bit written to the memory cell and the error detection provision comprises comparator logic for continuously sensing and comparing the contents of the memory sub-cells to one another and for outputting the error signal whenever the contents do not match. In accordance with one feature of the invention, the memory systematically searches for an error in response to an error signal and corrects the error found by the search.

REFERENCES:
patent: 3544777 (1970-12-01), Winkler
patent: 3646516 (1972-02-01), Flinders
patent: 4426699 (1984-01-01), Tanaka et al.
patent: 4639919 (1987-01-01), Chang et al.
patent: 4744061 (1988-05-01), Takemae et al.
patent: 4782488 (1988-11-01), Anderson
patent: 4792955 (1988-12-01), Johnson et al.

Affiliated with

Also associated with

Rating

Self-checking on-line testable static ram does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-checking on-line testable static ram, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-checking on-line testable static ram will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-541948