Method for testing conductor networks

Details Method for testing conductor networks Method for testing conductor networks

Filed on

1988-02-29

Date issued

1989-06-20

Examiner

Eisenzopf, Reinhard J.

Patent Class

Electricity: measuring and testing

SubClass

Measuring, testing, or sensing electricity, per se

SubSubClass

With rotor

Other Related Categories

324713, 324 73PC, G01R 3100, G01R 3102

Type

Patent

Status

active

Patent number

048412422

Description

ABSTRACT:
A method of testing conductor networks on printed circuit boards and wiring modules comprising charging various points on the conductor network with one or more charging beams while simultaneously irridating the conductor network with a large area holding beam which compensates for charge losses during the charge detecting period which determines whether shorts or open circuits occur in the network.

REFERENCES:
patent: 4417203 (1983-11-01), Pfeiffer et al.
patent: 4707609 (1987-11-01), Shimanura
patent: 4733174 (1988-03-01), Crosby
patent: 4755748 (1988-07-01), Lin
"Reducing Radiation Damage in Insulated-Gate Field-Effect Transistors", by Grosewald et al., IBM Tech. Disc. Bull., 8/71, vol. 14, #3, pp. 811-812.
A Dynamic SingleE-Beam Short/Open Testing Technique Scanning Electron Microscopy 1985, pp. 991-999, by Brunner et al., 7/85.

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