Semiconductor integrated circuit adapted to carry out operation

Details Semiconductor integrated circuit adapted to carry out operation Semiconductor integrated circuit adapted to carry out operation

1988-03-24

1989-06-20

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 21, 365201, G01R 3100, G11C 700, G11C 2900

Patent

active

048412333

ABSTRACT:
A semiconductor integrated circuit device includes a memory cell array, a decoder circuit, a selection circuit and a plurality of input/output terminals. The selection circuit is connected to one of the terminals and includes a high voltage detector circuit for producing a control signal only when a predetermined voltage higher than a power source voltage is applied to one of the terminals. The selection circuit further includes a latch circuit connected to the terminals other than the one terminal, for latching an input signal in response to a control signal produced from the high voltage detector circuit. When a predetermined high voltage is applied to the high voltage detector circuit through one of the terminals, the signal input from the other terminals is latched, in response to the control signal. The status of the memory cell array and the decoder circuit is made to a predetermined specific mode, based upon the latched signal.

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