Capacitor array sensors for determining conformity to surface sh

Details Capacitor array sensors for determining conformity to surface sh Capacitor array sensors for determining conformity to surface sh

1988-07-29

1990-03-13

Shoop, Jr., William M.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324690, 901 33, 901 46, 361283, G01B, G01B 734

Patent

active

049085743

ABSTRACT:
A sensor for sensing and quantifying the conformity of a workpiece surface contour to a predetermined design contour. The sensor consists of an array of capacitor elements on a surface having the negative image of the predetermined design contour, against which the workpiece is mated. In operation, each of the capacitor elements and the workpiece are connected to a corresponding oscillator circuit so that the frequency of each circuit is a function of the capacitance between the individual plate element and the workpiece, while the capacitance is a function of the distance between the individual plate element and the workpiece. Hence the overall output of the circuits is a function of the conformity of the workpiece surface contour to the contour or topology of the sensor surface.

REFERENCES:
patent: 2856582 (1958-10-01), Anderson
patent: 3651505 (1972-03-01), Schmidt
patent: 4103226 (1978-07-01), Fromson et al.
patent: 4352060 (1982-09-01), Garpendahl et al.
patent: 4413349 (1983-11-01), Bailey
patent: 4451780 (1984-05-01), Ogasawara
patent: 4557386 (1985-12-01), Buckley et al.
patent: 4588348 (1986-05-01), Beni et al.
patent: 4611296 (1986-09-01), Niedermayr

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