System for compensating for temperature induced delay variation

Details System for compensating for temperature induced delay variation System for compensating for temperature induced delay variation

1997-07-31

1999-12-21

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324760, G01R 3102

Patent

active

060054085

ABSTRACT:
A delay compensation circuit responds to a sensed change in operating temperature of a CMOS integrated circuit (IC) by appropriately adjusting the IC's power supply voltage so as to prevent the temperature change from affecting IC signal path delays. The delay compensation circuit senses the temperature change by monitoring a temperature sensitive voltage across a diode included in the IC and generates the power supply voltage as an appropriately adjusted linear function of the diode voltage.

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